[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Process optimizations for NBTI/PBTI for future replacement metal gate technologies
- 作者Linder, Barry P.; Dasgupta, A.; Ando, T.; Cartier, E.; Kwon, U.; Southwick, R.; Wang, M.; Krishnan, S. A.; Hopstaken, M.; Bajaj, M.; Pandey, R.; Chang, W.; Yamashita, T.; Gluschenkov, O.; Narayanan, V.; Stathis, J.; Ray, S.; Liu, J.
- 文件大小397.63KB
- 发表时间2016
- DOI10.1109/irps.2016.7574532
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