[IEEE IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society - Florence, Italy (2016.10.23-2016.10.26)] IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society - Real-time aging monitoring for power MOSFETs using threshold voltage

• 作者Lei Ren, ; Qian Shen, ; Chunying Gong,
• 文件大小1723.32KB
• 发表时间2016
• DOI10.1109/IECON.2016.7793625
• 页码441-446