[IEEE 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Chongqing, China (2016.7.18-2016.7.22)] 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Precision metrology with weak measurements using spin splitting of light

• 作者Qiu, Xiaodong; Xie, Linguo; Du, Jinglei; Zhang, Zhiyou; Du, Jinglei; Zhang, Zhiyou
• 文件大小351.49KB
• 发表时间2016
• DOI10.1109/3M-NANO.2016.7824979
• 页码379-382