Negative capacitance in optically sensitive metal-insulator-semiconductor-metal structures
Mikhelashvili, V.; Padmanabhan, R.; Meyler, B.; Yofis, S.; Eisenstein, G.
- 期刊名称Journal of Applied Physics
- 作者Mikhelashvili, V.; Padmanabhan, R.; Meyler, B.; Yofis, S.; Eisenstein, G.
- 卷第120卷
- 期第22期
- 印刷ISSN0021-8979
- 电子ISSN1089-7550
- 文件大小2865.26KB
- 发表时间2016-12-14
- DOI10.1063/1.4971401