![SPIE Proceedings [SPIE The International Conference on Quality Control by Artificial Vision 2017 - Tokyo, Japan (Sunday 14 May 2017)] Thirteenth International Conference on Quality Control by Artificial Vision 2017 - 3D geometrical characterization and modelling of solid oxide cells electrodes microstructure by image analysis]()
SPIE Proceedings [SPIE The International Conference on Quality Control by Artificial Vision 2017 - Tokyo, Japan (Sunday 14 May 2017)] Thirteenth International Conference on Quality Control by Artificial Vision 2017 - 3D geometrical characterization and modelling of solid oxide cells electrodes microstructure by image analysisNagahara, Hajime; Umeda, Kazunori; Yamashita, Atsushi; Moussaoui, H.; Debayle, J.; Gavet, Y.; Delette, G.; Hubert, M.; Cloetens, P.; Laurencin, J. · 2017