[IEEE 2016 IEEE Symposium Series on Computational Intelligence (SSCI) - Athens, Greece (2016.12.6-2016.12.9)] 2016 IEEE Symposium Series on Computational Intelligence (SSCI) - Computational Intelligence: Are you crazy? Since when has intelligence become computational?
- 作者Diamant, Emanuel
- 文件大小183.70KB
- 发表时间2016
- DOI10.1109/SSCI.2016.7850143
- 页码1-4
[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Committee2016
[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Front matters2016
[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Author index2016
[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Copyright page2016
[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Table of contents2016
[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Improved grayscale lithographyLaurvick, Tod; Coutu, Ronald A. · 2016
[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - QR decomposition using FPGAsParker, Michael; Mauer, Volker; Pritsker, Dan · 2016
[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - GPU-accelerated feature trackingGraves, Alexander · 2016
[IEEE NAECON 2017 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2017.6.27-2017.6.30)] 2017 IEEE National Aerospace and Electronics Conference (NAECON) - Using FTIR spectral response signals to separate, characterize and quantify the effects of silicone or rubber-based adhesive materials on microsphere lens enhanced MWIR SLS photo detectorsMegherbi, D. B.; Mack, P.; DiZoglio, J.; Vakil, M. I.; Limberopoulos, N.; Urbas, A. · 2017
[IEEE NAECON 2017 - IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2017.6.27-2017.6.30)] 2017 IEEE National Aerospace and Electronics Conference (NAECON) - A signal processing and data analysis technique for accurate extraction and estimation of FTIR signal aberrations in microsphere-lens-enhanced MWIR photo detectors via system transfer functions mathematical modelingMegherbi, D. B.; DiZoglio, J.; Mack, P.; Vakil, M. I.; Limberopoulos, N.; Urbas, A. · 2017
[IEEE NAECON 2018 - IEEE National Aerospace and Electronics Conference - Dayton, OH (2018.7.23-2018.7.26)] NAECON 2018 - IEEE National Aerospace and Electronics Conference - An Adaptive Technique for Automatic Region Detection and Extraction of FTIR Spectral Material Absorption for Mid-Wave Infrared Microsphere-Lens-Enhanced Type II Strained Layer Super-Lattice PhotodetectorsDiZoglio, J.; Megherbi, D. B.; Mack, P.; Vakil, M. I.; Limberopoulos, N.; Urbas, A. · 2018
[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Characterization and estimation of microsphere-lens misalignment from FTIR response data of microsphere-lens-enhanced MWIR SLS photo detectorsMegherbi, D. B.; DiZoglio, J.; Vakil, I.; Limberopoulos, N.; Urbas, A. · 2016