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[IEEE 2016 IEEE AUTOTESTCON - Anaheim, CA, USA (2016.9.12-2016.9.15)] 2016 IEEE AUTOTESTCON - Recommended practice for insuring reuse and integrity of ATS data by the application of IEEE SCC20/ATML standards

[IEEE 2016 IEEE AUTOTESTCON - Anaheim, CA, USA (2016.9.12-2016.9.15)] 2016 IEEE AUTOTESTCON - Recommended practice for insuring reuse and integrity of ATS data by the application of IEEE SCC20/ATML standards

Modi, Mukund; Stanco, Joe; Verbovsky, Patrick

作者Modi, Mukund; Stanco, Joe; Verbovsky, Patrick
文件大小396.37KB
发表时间2016
DOI10.1109/autest.2016.7589581
页码1-8

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