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[IEEE 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2016.5.31-2016.6.3)] 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Effect of Temperature on the High Strain Rate Properties of SAC Leadfree Alloys at Temperatures up to 200°C

[IEEE 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2016.5.31-2016.6.3)] 2016 IEEE 66th Electronic Components and Technology Conference (ECTC) - Effect of Temperature on the High Strain Rate Properties of SAC Leadfree Alloys at Temperatures up to 200°C

Lall, Pradeep; Zhang, Di; Yadav, Vikas; Suhling, Jeff; Locker, David
  • 作者Lall, Pradeep; Zhang, Di; Yadav, Vikas; Suhling, Jeff; Locker, David
  • 文件大小467.46KB
  • 发表时间2016
  • DOI10.1109/ectc.2016.397
  • 页码1924-1932
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