[IEEE IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society - Florence, Italy (2016.10.23-2016.10.26)] IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society - Ringing frequency extraction for health monitoring of power transistors
Lei Ren, ; Qian Shen, ; Chunying Gong,
- 作者Lei Ren, ; Qian Shen, ; Chunying Gong,
- 文件大小1486.70KB
- 发表时间2016
- DOI10.1109/IECON.2016.7793387
- 页码447-452