[IEEE 2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) - Jeju, South Korea (2016.10.25-2016.10.28)] 2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS) - Test access mechaism for stack test time reduction of 3-dimensional integrated circuit

• 作者Choi, Inhyuk; Oh, Hyunggoy; Kang, Sungho
• 文件大小127.27KB
• 发表时间2016
• DOI10.1109/apccas.2016.7804019
• 页码522-525