[IEEE 2016 5th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Noida, India (2016.9.7-2016.9.9)] 2016 5th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Processing architecture based on measurement metadata

• 作者Divan, Mario Jose
• 文件大小414.29KB
• 发表时间2016
• DOI10.1109/icrito.2016.7784912
• 页码6-15