[IEEE 2016 39th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) - Opatija, Croatia (2016.5.30-2016.6.3)] 2016 39th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) - Extended approach to selecting a project-specific reliability growth model
Krini, Jamal; Krini, Abderrahim; Krini, Ossmane; Borcsok, Josef
- 作者Krini, Jamal; Krini, Abderrahim; Krini, Ossmane; Borcsok, Josef
- 文件大小312.08KB
- 发表时间2016
- DOI10.1109/mipro.2016.7522318
- 页码1179-1184