[IEEE 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2016.7.18-2016.7.21)] 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Simulation assisted uncovering and understanding of complex failures in 28nm microprocessor devices
Khatri, Dnyan; Narang, Vinod; Ho, Mun Yee; Pandey, Komal; Yu, Ran
- 作者Khatri, Dnyan; Narang, Vinod; Ho, Mun Yee; Pandey, Komal; Yu, Ran
- 文件大小692.57KB
- 发表时间2016
- DOI10.1109/ipfa.2016.7564249
- 页码64-68