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[IEEE 2016 5th IIAI International Congress on Advanced Applied Informatics (IIAI-AAI) - Kumamoto, Japan (2016.7.10-2016.7.14)] 2016 5th IIAI International Congress on Advanced Applied Informatics (IIAI-AAI) - Bias Reduction of Abilities for Adaptive Online IRT Testing Systems

[IEEE 2016 5th IIAI International Congress on Advanced Applied Informatics (IIAI-AAI) - Kumamoto, Japan (2016.7.10-2016.7.14)] 2016 5th IIAI International Congress on Advanced Applied Informatics (IIAI-AAI) - Bias Reduction of Abilities for Adaptive Online IRT Testing Systems

Sakumura, Takenori; Hirose, Hideo

作者Sakumura, Takenori; Hirose, Hideo
文件大小838.33KB
发表时间2016
DOI10.1109/iiai-aai.2016.122
页码450-455

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