Performance of GaN-on-Si-based vertical light-emitting diodes using silicon nitride electrodes with conducting filaments: correlation between filament density and device reliability
- 期刊名称Optics Express
- 作者Kim, Kyeong Heon; Kim, Su Jin; Lee, Tae Ho; Lee, Byeong Ryong; Kim, Tae Geun
- 卷第24卷
- 期第16期
- 电子ISSN1094-4087
- 文件大小4879.00KB
- 发表时间2016-08-08
- DOI10.1364/oe.24.017711
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