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AIP Conference Proceedings [Author(s) ICXOM23: International Conference on X-ray Optics and Microanalysis - Upton, NY, USA (14–18 September 2015)] - A dedicated illumination for full-field X-ray microscopy with multilayer Laue lenses

AIP Conference Proceedings [Author(s) ICXOM23: International Conference on X-ray Optics and Microanalysis - Upton, NY, USA (14–18 September 2015)] - A dedicated illumination for full-field X-ray microscopy with multilayer Laue lenses

Niese, Sven; Braun, Stefan; Dietsch, Reiner; Gluch, Jürgen; Holz, Thomas; Huber, Norman; Kubec, Adam; Zschech, Ehrenfried
  • 作者Niese, Sven; Braun, Stefan; Dietsch, Reiner; Gluch, Jürgen; Holz, Thomas; Huber, Norman; Kubec, Adam; Zschech, Ehrenfried
  • 卷第1764卷
  • 印刷ISSN0094-243X
  • 文件大小3303.27KB
  • 发表时间2016
  • DOI10.1063/1.4961130
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