Oxide trap states versus gas sensing in SiC-MOS capacitors – The effect of N- and P- based post oxidation processes
Pascu, Razvan; Craciunoiu, Florea; Pristavu, Gheorghe; Brezeanu, Gheorghe; Kusko, Mihaela
- 期刊名称Sensors and Actuators B: Chemical
- 作者Pascu, Razvan; Craciunoiu, Florea; Pristavu, Gheorghe; Brezeanu, Gheorghe; Kusko, Mihaela
- 卷第245卷
- 印刷ISSN0925-4005
- 文件大小1451.49KB
- 发表时间2017-06
- DOI10.1016/j.snb.2017.02.044
- 页码911-922