Open-Circuit IGBT Fault Detection and Location Isolation for Cascaded Multilevel Converters
- 期刊名称IEEE Transactions on Industrial Electronics
- 作者Lamb, Jacob; Mirafzal, Behrooz
- 印刷ISSN0278-0046
- 电子ISSN1557-9948
- 文件大小3675.26KB
- 发表时间2017
- DOI10.1109/TIE.2017.2674629
- 页码1-1
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