Surface Damage Mechanism of Monocrystalline Si Under Mechanical Loading
Zhao, Qingliang; Zhang, Quanli; To, Suet; Guo, Bing
- 期刊名称Journal of Electronic Materials
- 作者Zhao, Qingliang; Zhang, Quanli; To, Suet; Guo, Bing
- 卷第46卷
- 期第3期
- 印刷ISSN0361-5235
- 电子ISSN1543-186X
- 文件大小1527.30KB
- 发表时间2017-3
- DOI10.1007/s11664-016-5251-5
- 页码1862-1868