发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

$Characterization of critical conditions for fracture during wafer testing by FEM and experiments$

Characterization of critical conditions for fracture during wafer testing by FEM and experiments

Ochoa Brezmes, Angel; Reuther, Georg; Gneupel, Andreas; Breitkopf, Cornelia

期刊名称Materials Science in Semiconductor Processing
作者Ochoa Brezmes, Angel; Reuther, Georg; Gneupel, Andreas; Breitkopf, Cornelia
卷第67卷
印刷ISSN1369-8001
文件大小3042.67KB
发表时间2017-08
DOI10.1016/j.mssp.2017.05.020
页码124-140

← 返回【学霸图书馆】主页