Sample rotation improves gas cluster sputter depth profiling of polymers
Smith, Emily F.; Counsell, Jonathan D. P.; Bailey, James; Sharp, James S.; Alexander, Morgan R.; Shard, Alexander G.; Scurr, David J.
- 期刊名称Surface and Interface Analysis
- 作者Smith, Emily F.; Counsell, Jonathan D. P.; Bailey, James; Sharp, James S.; Alexander, Morgan R.; Shard, Alexander G.; Scurr, David J.
- 印刷ISSN0142-2421
- 文件大小472.17KB
- 发表时间2017-05-26
- DOI10.1002/sia.6250