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Sample rotation improves gas cluster sputter depth profiling of polymers

Sample rotation improves gas cluster sputter depth profiling of polymers

Smith, Emily F.; Counsell, Jonathan D. P.; Bailey, James; Sharp, James S.; Alexander, Morgan R.; Shard, Alexander G.; Scurr, David J.
  • 期刊名称Surface and Interface Analysis
  • 作者Smith, Emily F.; Counsell, Jonathan D. P.; Bailey, James; Sharp, James S.; Alexander, Morgan R.; Shard, Alexander G.; Scurr, David J.
  • 印刷ISSN0142-2421
  • 文件大小472.17KB
  • 发表时间2017-05-26
  • DOI10.1002/sia.6250
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