Efficient Verification Against Undesired Operating Points for MOS Analog Circuits
- 期刊名称IEEE Transactions on Circuits and Systems I: Regular Papers
- 作者Li, You; Liu, Zhiqiang; Chen, Degang
- 印刷ISSN1549-8328
- 电子ISSN1558-0806
- 文件大小2258.56KB
- 发表时间2017
- DOI10.1109/TCSI.2017.2693208
- 页码1-12
同作者推荐
Deep Learning-Based Mobile Application Isomorphic GUI Identification for Automated Robotic TestingZhang, Tao; Liu, Ying; Gao, Jerry; Gao, Li Peng; Cheng, Jing · IEEE Software · 2020
[IEEE 2015 IEEE Symposium on Service-Oriented System Engineering (SOSE) - San Francisco Bay, CA, USA (2015.3.30-2015.4.3)] 2015 IEEE Symposium on Service-Oriented System Engineering - Compatibility Testing Service for Mobile ApplicationsZhang, Tao; Gao, Jerry; Cheng, Jing; Uehara, Tadahiro · 2015