Nonparametric Bayesian Analysis for Masked Data From Hybrid Systems in Accelerated Lifetime Tests
Liu, Bin; Shi, Yimin; Cai, Jing; Bai, Xuchao; Zhang, Chunfang
- 期刊名称IEEE Transactions on Reliability
- 作者Liu, Bin; Shi, Yimin; Cai, Jing; Bai, Xuchao; Zhang, Chunfang
- 印刷ISSN0018-9529
- 电子ISSN1558-1721
- 文件大小708.49KB
- 发表时间2017
- DOI10.1109/TR.2017.2704582
- 页码1-15