Statistical Deviations from the Theoretical only-SBU Model to Estimate MCU rates in SRAMs
Franco, Francisco J.; Clemente, Juan Antonio; Baylac, Maud; Rey, Solenne; Villa, Francesca; Mecha, Hortensia; Agapito, Juan A.; Puchner, Helmut; Hubert, Guillaume; Velazco, Raoul
- 期刊名称IEEE Transactions on Nuclear Science
- 作者Franco, Francisco J.; Clemente, Juan Antonio; Baylac, Maud; Rey, Solenne; Villa, Francesca; Mecha, Hortensia; Agapito, Juan A.; Puchner, Helmut; Hubert, Guillaume; Velazco, Raoul
- 印刷ISSN0018-9499
- 电子ISSN1558-1578
- 文件大小743.17KB
- 发表时间2017
- DOI10.1109/TNS.2017.2726938
- 页码1-1