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Statistical Deviations from the Theoretical only-SBU Model to Estimate MCU rates in SRAMs

Statistical Deviations from the Theoretical only-SBU Model to Estimate MCU rates in SRAMs

Franco, Francisco J.; Clemente, Juan Antonio; Baylac, Maud; Rey, Solenne; Villa, Francesca; Mecha, Hortensia; Agapito, Juan A.; Puchner, Helmut; Hubert, Guillaume; Velazco, Raoul
  • 期刊名称IEEE Transactions on Nuclear Science
  • 作者Franco, Francisco J.; Clemente, Juan Antonio; Baylac, Maud; Rey, Solenne; Villa, Francesca; Mecha, Hortensia; Agapito, Juan A.; Puchner, Helmut; Hubert, Guillaume; Velazco, Raoul
  • 印刷ISSN0018-9499
  • 电子ISSN1558-1578
  • 文件大小743.17KB
  • 发表时间2017
  • DOI10.1109/TNS.2017.2726938
  • 页码1-1
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