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SPIE Proceedings [SPIE Critical Review Collection - Bellingham, United States (Friday 13 January 2017)] Standards for Electronics Imaging Technologies, Devices, and Systems: A Critical Review - Survey of standards for image telecommunications

SPIE Proceedings [SPIE Critical Review Collection - Bellingham, United States (Friday 13 January 2017)] Standards for Electronics Imaging Technologies, Devices, and Systems: A Critical Review - Survey of standards for image telecommunications

Urban, Stephen

作者Urban, Stephen
卷第10283卷
印刷ISSN0277-786X
文件大小538.68KB
发表时间2017
DOI10.1117/12.229254

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