$X-ray diffraction measurements of plasticity in shock-compressed vanadium in the region of 10–70 GPa$

X-ray diffraction measurements of plasticity in shock-compressed vanadium in the region of 10–70 GPa

Foster, J. M.; Comley, A. J.; Case, G. S.; Avraam, P.; Rothman, S. D.; Higginbotham, A.; Floyd, E. K. R.; Gumbrell, E. T.; Luis, J. J. D.; McGonegle, D.; Park, N. T.; Peacock, L. J.; Poulter, C. P.; Suggit, M. J.; Wark, J. S.

期刊名称Journal of Applied Physics
作者Foster, J. M.; Comley, A. J.; Case, G. S.; Avraam, P.; Rothman, S. D.; Higginbotham, A.; Floyd, E. K. R.; Gumbrell, E. T.; Luis, J. J. D.; McGonegle, D.; Park, N. T.; Peacock, L. J.; Poulter, C. P.; Suggit, M. J.; Wark, J. S.
卷第122卷
期第2期
印刷ISSN0021-8979
电子ISSN1089-7550
文件大小3925.30KB
发表时间2017-07-14
DOI10.1063/1.4994167

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X-ray diffraction measurements of plasticity in shock-compressed vanadium in the region of 10–70 GPa