A Testbed for Simulating Semiconductor Supply Chains
- 期刊名称IEEE Transactions on Semiconductor Manufacturing
- 作者Ewen, Hanna; Monch, Lars; Ehm, Hans; Ponsignon, Thomas; Fowler, John W.; Forstner, Lisa
- 卷第30卷
- 期第3期
- 印刷ISSN0894-6507
- 电子ISSN1558-2345
- 文件大小888.06KB
- 发表时间2017-8
- DOI10.1109/TSM.2017.2713775
- 页码293-305
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