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Tuning electrical properties of Au/n-InP junctions by inserting atomic layer deposited Al 2 O 3  layer

Tuning electrical properties of Au/n-InP junctions by inserting atomic layer deposited Al 2 O 3 layer

Kim, Hogyoung; Kim, Dong Ha; Ryu, Sungyeon; Choi, Byung Joon
  • 期刊名称Vacuum
  • 作者Kim, Hogyoung; Kim, Dong Ha; Ryu, Sungyeon; Choi, Byung Joon
  • 印刷ISSN0042-207X
  • 文件大小1083.08KB
  • 发表时间2017-8
  • DOI10.1016/j.vacuum.2017.08.004
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