Tuning electrical properties of Au/n-InP junctions by inserting atomic layer deposited Al 2 O 3 layer
Kim, Hogyoung; Kim, Dong Ha; Ryu, Sungyeon; Choi, Byung Joon
- 期刊名称Vacuum
- 作者Kim, Hogyoung; Kim, Dong Ha; Ryu, Sungyeon; Choi, Byung Joon
- 印刷ISSN0042-207X
- 文件大小1083.08KB
- 发表时间2017-8
- DOI10.1016/j.vacuum.2017.08.004