Quantification of Sheet Resistance in Boron-Diffused Silicon Using Micro-Photoluminescence Spectroscopy at Room Temperature

Nguyen, Hieu T.; Johnston, Steve; Paduthol, Appu; Harvey, Steven P.; Phang, Sieu Pheng; Samundsett, Christian; Sun, Chang; Yan, Di; Trupke, Thorsten; Al-Jassim, Mowafak M.; Macdonald, Daniel

期刊名称Solar RRL
作者Nguyen, Hieu T.; Johnston, Steve; Paduthol, Appu; Harvey, Steven P.; Phang, Sieu Pheng; Samundsett, Christian; Sun, Chang; Yan, Di; Trupke, Thorsten; Al-Jassim, Mowafak M.; Macdonald, Daniel
印刷ISSN2367-198X
文件大小2244.31KB
发表时间2017-09-01
DOI10.1002/solr.201700088

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Quantification of Sheet Resistance in Boron-Diffused Silicon Using Micro-Photoluminescence Spectroscopy at Room Temperature