Comparative analysis of methods for measurement of the surface potential of dielectrics charging under electron-beam irradiation in a scanning electron microscope
Rau, E. I.; Tatarintsev, A. A.; Kupreenko, S. Yu.; Zaitsev, S. V.; Podbutsky, N. G.
- 期刊名称Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
- 作者Rau, E. I.; Tatarintsev, A. A.; Kupreenko, S. Yu.; Zaitsev, S. V.; Podbutsky, N. G.
- 卷第11卷
- 期第5期
- 印刷ISSN1027-4510
- 电子ISSN1819-7094
- 文件大小687.64KB
- 发表时间2017-9
- DOI10.1134/S1027451017050354
- 页码1062-1068