Modelling the temperature influence on dc characteristics of the IGBT
- 期刊名称Microelectronics Reliability
- 作者Górecki, Paweł; Górecki, Krzysztof; Zarębski, Janusz
- 卷第79卷
- 印刷ISSN0026-2714
- 文件大小868.32KB
- 发表时间2017-12
- DOI10.1016/j.microrel.2017.10.019
- 页码96-103
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