Nanospectroscopy Imaging Techniques: Using NSOM and TERS for Semiconductor Materials Imaging
Yin, Yu-Tung; Lin, Hung-Ming; Wang, Chia-Ching; Chou, Mei-Hua; Chou, Shih-Jie; Kuo, Yu-Shuan; Kim, DongHyun; Chen, Liang-Yih; Chen, Ching-Hsiang
- 期刊名称IEEE Nanotechnology Magazine
- 作者Yin, Yu-Tung; Lin, Hung-Ming; Wang, Chia-Ching; Chou, Mei-Hua; Chou, Shih-Jie; Kuo, Yu-Shuan; Kim, DongHyun; Chen, Liang-Yih; Chen, Ching-Hsiang
- 卷第11卷
- 期第4期
- 印刷ISSN1932-4510
- 文件大小2262.94KB
- 发表时间2017-12
- DOI10.1109/MNANO.2017.2746992
- 页码14-19