[IEEE 2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) - Riga, Latvia (2017.11.24-2017.11.25)] 2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE) - Comparison of LC-VCO and LC-DCO parameters in 65 nm CMOS technology
Macaitis, V.; Navickas, R.
- 作者Macaitis, V.; Navickas, R.
- 文件大小294.36KB
- 发表时间2017
- DOI10.1109/AIEEE.2017.8270549
- 页码1-4