[IEEE 2017 IEEE Nuclear & Space Radiation Effects Conference (NSREC): Radiation Effects Data Workshop (REDW) - New Orleans, LA (2017.7.17-2017.7.21)] 2017 IEEE Radiation Effects Data Workshop (REDW) - Space and Terrestrial Radiation Response of Silicon Carbide Power MOSFETs
- 作者Akturk, Akin; McGarrity, James M.; Wilkins, Richard; Markowski, Adam; Cusack, Brendan
- 文件大小549.61KB
- 发表时间2017
- DOI10.1109/nsrec.2017.8115467
- 页码1-5
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