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[IEEE 2017 IEEE Energy Conversion Congress and Exposition (ECCE) - Cincinnati, OH (2017.10.1-2017.10.5)] 2017 IEEE Energy Conversion Congress and Exposition (ECCE) - Monitoring transistor degradation in power electronic converters using saturation-region resistance

[IEEE 2017 IEEE Energy Conversion Congress and Exposition (ECCE) - Cincinnati, OH (2017.10.1-2017.10.5)] 2017 IEEE Energy Conversion Congress and Exposition (ECCE) - Monitoring transistor degradation in power electronic converters using saturation-region resistance

Ren, Lei; Gong, Chunying; Chen, Xin

作者Ren, Lei; Gong, Chunying; Chen, Xin
文件大小372.27KB
发表时间2017
DOI10.1109/ECCE.2017.8095918
页码1148-1153

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