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[IEEE 2017 IEEE 12th International Conference on ASIC (ASICON) - Guiyang (2017.10.25-2017.10.28)] 2017 IEEE 12th International Conference on ASIC (ASICON) - Hot carrier reliability in ultra-scaled sige channel p-FinFETs

[IEEE 2017 IEEE 12th International Conference on ASIC (ASICON) - Guiyang (2017.10.25-2017.10.28)] 2017 IEEE 12th International Conference on ASIC (ASICON) - Hot carrier reliability in ultra-scaled sige channel p-FinFETs

Wang, Miaomiao; Miao, Xin; Stathis, James H; Southwick, Richard

作者Wang, Miaomiao; Miao, Xin; Stathis, James H; Southwick, Richard
文件大小793.97KB
发表时间2017
DOI10.1109/ASICON.2017.8252563
页码666-669

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