Adaptive Test with Test Escape Estimation for Mixed-Signal ICs

• 期刊名称IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
• 作者Stratigopoulos, Haralampos-G.; Streitwieser, Christian
• 印刷ISSN0278-0070
• 电子ISSN1937-4151
• 文件大小784.84KB
• 发表时间2017
• DOI10.1109/tcad.2017.2783302
• 页码1-1