[IEEE 2017 30th International Vacuum Nanoelectronics Conference (IVNC) - Regensburg, Germany (2017.7.10-2017.7.14)] 2017 30th International Vacuum Nanoelectronics Conference (IVNC) - Field-emission electron microscope development and cathode emittance
Enderich, D.; Booske, J.; Behdad, N.
- 作者Enderich, D.; Booske, J.; Behdad, N.
- 文件大小326.93KB
- 发表时间2017
- DOI10.1109/IVNC.2017.8051635
- 页码260-261