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[IEEE 2017 30th International Vacuum Nanoelectronics Conference (IVNC) - Regensburg, Germany (2017.7.10-2017.7.14)] 2017 30th International Vacuum Nanoelectronics Conference (IVNC) - Field-emission electron microscope development and cathode emittance

[IEEE 2017 30th International Vacuum Nanoelectronics Conference (IVNC) - Regensburg, Germany (2017.7.10-2017.7.14)] 2017 30th International Vacuum Nanoelectronics Conference (IVNC) - Field-emission electron microscope development and cathode emittance

Enderich, D.; Booske, J.; Behdad, N.
  • 作者Enderich, D.; Booske, J.; Behdad, N.
  • 文件大小326.93KB
  • 发表时间2017
  • DOI10.1109/IVNC.2017.8051635
  • 页码260-261
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