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[IEEE 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Kamakura, Japan (2017.9.7-2017.9.9)] 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Comparison of basis sets for efficient Ab-initio modeling of semiconductors

[IEEE 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Kamakura, Japan (2017.9.7-2017.9.9)] 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Comparison of basis sets for efficient Ab-initio modeling of semiconductors

Vaidya, Dhirendra; Lodha, Saurabh; Ganguly, Swaroop

作者Vaidya, Dhirendra; Lodha, Saurabh; Ganguly, Swaroop
文件大小438.11KB
发表时间2017
DOI10.23919/SISPAD.2017.8085290
页码165-168

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