发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Application of electro optical frequency mapping (EOFM) in scan chain failure analysis for ASIC

[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Application of electro optical frequency mapping (EOFM) in scan chain failure analysis for ASIC

Sheng, Foo Loke; Ling, Leow Jack
  • 作者Sheng, Foo Loke; Ling, Leow Jack
  • 文件大小753.11KB
  • 发表时间2017
  • DOI10.1109/IPFA.2017.8060220
  • 页码1-5
同期刊推荐
← 返回【学霸图书馆】主页
© 2026 学霸图书馆 · 让阅读成为习惯