发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

[IEEE 2017 IEEE International Symposium on Nanoelectronic and Information Systems (iNIS) - Bhopal, India (2017.12.18-2017.12.20)] 2017 IEEE International Symposium on Nanoelectronic and Information Systems (iNIS) - Fault Sensitive Neutralization of Hardware Trojans Using Multi-level Triple Modular Redundancy Scheme

[IEEE 2017 IEEE International Symposium on Nanoelectronic and Information Systems (iNIS) - Bhopal, India (2017.12.18-2017.12.20)] 2017 IEEE International Symposium on Nanoelectronic and Information Systems (iNIS) - Fault Sensitive Neutralization of Hardware Trojans Using Multi-level Triple Modular Redundancy Scheme

Gunti, Nagendra Babu; Lingasubramanian, Karthikeyan
  • 作者Gunti, Nagendra Babu; Lingasubramanian, Karthikeyan
  • 文件大小671.03KB
  • 发表时间2017
  • DOI10.1109/iNIS.2017.31
  • 页码105-110
← 返回【学霸图书馆】主页