[IEEE 2017 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) - Pavia (2017.9.20-2017.9.22)] 2017 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP) - Synthetic holography at infrared wavelength for nanostructure imaging: Scanning microscopy based on extrinsic microcavity
Di Donato, A.; Farina, M.; Stocchi, M.; Mencarelli, D.; Pierantoni, L.
- 作者Di Donato, A.; Farina, M.; Stocchi, M.; Mencarelli, D.; Pierantoni, L.
- 文件大小2253.94KB
- 发表时间2017
- DOI10.1109/IMWS-AMP.2017.8247393
- 页码1-3