A Fast Logic Mapping Algorithm for Multiple-type-Defect Tolerance in Reconfigurable Nano-Crossbar Arrays

• 期刊名称IEEE Transactions on Emerging Topics in Computing
• 作者Tunali, Onur; Altun, Mustafa
• 电子ISSN2168-6750
• 文件大小4337.95KB
• 发表时间2017
• DOI10.1109/tetc.2017.2755458
• 页码1-1