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Non-Destructive Defect Detection of Apples by Spectroscopic and Imaging Technologies: A Review

Non-Destructive Defect Detection of Apples by Spectroscopic and Imaging Technologies: A Review

Lu, Yuzhen; Lu, Renfu

期刊名称Transactions of the ASABE
作者Lu, Yuzhen; Lu, Renfu
卷第60卷
期第5期
电子ISSN2151-0040
文件大小5546.82KB
发表时间2017
DOI10.13031/trans.12431
页码1765-1790

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