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Effects of Liner Thickness on the Reliability of AgTe/TiO
              <sub/>2</sub>
              -Based Threshold Switching Devices

Effects of Liner Thickness on the Reliability of AgTe/TiO 2 -Based Threshold Switching Devices

Song, Jeonghwan; Woo, Jiyong; Yoo, Jongmyung; Chekol, Solomon Amsalu; Lim, Seokjae; Sung, Changhyuck; Hwang, Hyunsang
  • 期刊名称IEEE Transactions on Electron Devices
  • 作者Song, Jeonghwan; Woo, Jiyong; Yoo, Jongmyung; Chekol, Solomon Amsalu; Lim, Seokjae; Sung, Changhyuck; Hwang, Hyunsang
  • 卷第64卷
  • 期第11期
  • 印刷ISSN0018-9383
  • 电子ISSN1557-9646
  • 文件大小1163.50KB
  • 发表时间2017-11
  • DOI10.1109/TED.2017.2747589
  • 页码4763-4767
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