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[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - High resistive via localization using electro optical techniques

[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - High resistive via localization using electro optical techniques

Jinrong, Song; Diwei, Fan; Xue, Guo; Chi, He

作者Jinrong, Song; Diwei, Fan; Xue, Guo; Chi, He
文件大小3123.54KB
发表时间2017
DOI10.1109/ipfa.2017.8060132
页码1-4

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