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[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - On-line monitoring of system health using on-chip SRAMs as a wearout sensor

[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - On-line monitoring of system health using on-chip SRAMs as a wearout sensor

Kim, Woongrae; Liu, Taizhi; Milor, Linda

作者Kim, Woongrae; Liu, Taizhi; Milor, Linda
文件大小711.00KB
发表时间2017
DOI10.1109/iolts.2017.8046230
页码253-258

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