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Effect of Post Annealing on the Structural Properties of Vanadium Oxide Thin Film Deposited by RF Sputtering

Effect of Post Annealing on the Structural Properties of Vanadium Oxide Thin Film Deposited by RF Sputtering

Gupta, Kapil; Kumar, Sarvesh

期刊名称Indian Journal of Science and Technology
作者Gupta, Kapil; Kumar, Sarvesh
卷第10卷
期第42期
印刷ISSN0974-6846
电子ISSN0974-5645
文件大小304.59KB
发表时间2017-11-01
DOI10.17485/ijst/2017/v10i42/115790
页码1-5

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