Robust procedure for creating and characterizing the atomic structure of scanning tunneling microscope tips
Tewari, Sumit; Bastiaans, Koen M; Allan, Milan P; van Ruitenbeek, Jan M
- 期刊名称Beilstein Journal of Nanotechnology
- 作者Tewari, Sumit; Bastiaans, Koen M; Allan, Milan P; van Ruitenbeek, Jan M
- 卷第8卷
- 电子ISSN2190-4286
- 文件大小4411.62KB
- 发表时间2017-11-13
- DOI10.3762/bjnano.8.238
- 页码2389-2395