Characterization of Seed Rot Resistance to in Soybean
Urrea, Keiddy; Rupe, John; Chen, Pengyin; Rothrock, Craig S.
- 期刊名称Crop Science
- 作者Urrea, Keiddy; Rupe, John; Chen, Pengyin; Rothrock, Craig S.
- 卷第57卷
- 期第3期
- 电子ISSN0011-183X
- 文件大小5911.96KB
- 发表时间2017
- DOI10.2135/cropsci2016.08.0669